Fabrication and Evaluation of Organic Field-Effect Transistors (OFETs) : 5T

Fabrication and evaluation of vacuum-deposited 5T [Q0079]-based OFETs

< Substrate >

• Bare Si/SiO₂ (thickness of SiO₂: 200 nm)

< Vacuum Deposition >

• Deposition rate of 5T [Q0079] 0.25 Å/s (under a pressure of∼10⁻⁴ Pa)
• Substrate temperature during deposition: RT
• Deposition rate of Au: 1.5 Å/s (under a pressure of∼10⁻⁴ Pa)

< Device Configuration >

• [n⁺-Si/SiO₂ (200 nm) / 5T [Q0079] (60 nm) / Au (40 nm)]
• Top-Contact Bottom-Gate Type (TCBG)
• Channel Length: 50 μm
• Channel width: 1.5 mm

< Evaluation Condition >

• Under N₂
• Field-effect mobilities (μ) were determined from the transfer curves in the saturation regime using the following equation:
  I_D = (W/2L) μ Ci (V_G − V_th)²